Flip Chip Test Wafer Pac 2.0

Wafer specifications

  • 8“ silicon wafer
    – other substrates / semiconductor materials
    – on request (e.g. glass, GaAs)

General data

chip no chips size / mm pitch / µm pad configuration I/O’s chips per wafer
1 10,0 x 10,0 200 peripheral 184 49
2 “ 300 peripheral 120 49
3 “ 200/400 area 572 49
4 “ 250 staggered 284 47
5 “ 100 peripheral 376 45

Bump specifications

Available with following bump types

  • Electroless Ni/Au (5μm, 10μm, 15μm and 25μm)
    for ACF, NCP and ICA adhesive Flip Chip attach
  • Solder bumps
    – SnPb 63/37, SnAg4Cu0,5
    – other alloys on request (e.g. PbSn 90/10, AuSn 80/20)

Electrical measurements

  • Daisy Chain Structures
  • Four Point Kelvin Structures

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